Swissbit U-56n Industrial USB Flash Drives
Swissbit U-56n Industrial USB Flash Drives offer page-based flash management with everbit™ technology for increased endurance and random performance. These drives feature optimized FW algorithms ideal for high read access and long data retention applications. Swissbit U-56n Industrial USB Flash Drives are available in 4GB, 8GB, 16GB, and 32GB densities with a 24mm x 12.1mm x 4.5mm form factor. These drives are USB 3.1 Gen 1 SuperSpeed specification compatible and backward compliant with USB 2.0/1.1. The U-56n series offers two operating temperature range options: commercial (0°C to +70°C) and industrial (-40°C to +85°C).Features
- Page-based flash management with everbit technology for increased endurance and random performance
- Optimized FW algorithms, especially for high read access and long data retention applications
- Data care management
- LED for operation indication
- Detailed support for Self-Monitoring, Analysis, and Reporting Technology (S.M.A.R.T.) and extended vendor information
- In-field firmware update
- 30μ" gold-plated USB 3.0 Type-A connector contacts
- Swissbit Life Time Monitoring (SBLTM) tool
Specifications
- 4GB, 8GB, 16GB, and 32GB capacities
- 24mm x 12.1mm x 4.5mm form factor
- Compliance: USB 3.1 Gen 1 SuperSpeed specification compatible (backward compliant with USB 2.0/1.1)
- Performance
- Read: sequential up to 190MB/s, random read IOPS up to 4,400
- Write: sequential up to 125MB/s, random write IOPS up to 1,600
- Operating temperature range
- Commercial: 0°C to +70°C
- Industrial and storage: -40°C to +85°C
- 5V ±10% operating voltage
- 10-year data retention at life begin, 1 year at life end
- Endurance in terabytes written (TBW) at maximum capacity
- 697 (sequential write 128KB)
- 42 (random write 4KB)
- High-performance 32-bit processor with integrated, parallel flash interface engines
- Multi-level cell (MLC) NAND flash in pSLC mode
- Hardware BCH code ECC (up to 40-bit correction per 1KB page)
- >3M hours meantime between failures (MTBF)
- Data reliability of <1 non-recoverable error per 1016 bits read
Veröffentlichungsdatum: 2020-03-02
| Aktualisiert: 2024-12-04
