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TE Connectivity / Holsworthy RN73 High Precision Resistors

TE Connectivity / Holsworthy RN73 High Precision Resistors are stable precision chip resistors offering a range of various power dissipation relating to chip size, TCRs down to 5ppm/°C and 10ppm/°C, and resistor tolerances to 0.1%. The components are produced with three sputtered layers to offer better performance. The RN73 resistors feature values restricted to the E96 grid and have accurate and uniform physical dimensions to facilitate placement. Ideal application includes communications, industrial controls, instrumentation, and medical.

Features

  • High precision, TCR 5ppm/°C and 10ppm/°C
  • Tolerance down to 0.01%
  • Thin film (nichrome)
  • Terminal finish: electroplated 100% matte Sn

Applications

  • Communications
  • Industrial controls
  • Instrumentation
  • Medical

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Teilnummer Datenblatt Beschreibung Widerstand Nennspannung
RN73C1E100RBTDF RN73C1E100RBTDF Datenblatt Dünnfilmwiderstände - SMD RN 0402 1%00R 0.1% 10PPM 100 Ohms 50 V
RN73C1J2K43BTDF RN73C1J2K43BTDF Datenblatt Dünnfilmwiderstände - SMD RN 0603 2K43 0.1% 10PPM 2.43 kOhms 100 V
RN73C2A40K2BTD RN73C2A40K2BTD Datenblatt Dünnfilmwiderstände - SMD RN 0805 40K2 0.1% 10PPM 5KRL 40.2 kOhms 200 V
RN73C2A5K62BTG RN73C2A5K62BTG Datenblatt Dünnfilmwiderstände - SMD RN 0805 5K62 0.1% 10PPM CUT LENGTH 5.62 kOhms 200 V
RN73C1E2K32BTD RN73C1E2K32BTD Datenblatt Dünnfilmwiderstände - SMD RN 0402 2K32 0.1% 10PPM 5K RL 2.32 kOhms 25 V
RN73C1J442KBTD RN73C1J442KBTD Datenblatt Dünnfilmwiderstände - SMD RN 0603 442K 0.1% 10PPM 5K RL 442 kOhms 50 V
RN73C1E316RBTD RN73C1E316RBTD Datenblatt Dünnfilmwiderstände - SMD RN 0402 316R 0.1% 10PPM 5K RL 316 Ohms 50 V
RN73C1E4K02BTD RN73C1E4K02BTD Datenblatt Dünnfilmwiderstände - SMD RN 0402 4K02 0.1% 10PPM 5K RL 4.02 kOhms 25 V
RN73C2A1K13BTD RN73C2A1K13BTD Datenblatt Dünnfilmwiderstände - SMD RN 0805 1K13 0.1% 10PPM 5KRL 1.13 kOhms 200 V
RN73C1E12K4BTD RN73C1E12K4BTD Datenblatt Dünnfilmwiderstände - SMD RN 0402 1%2K4 0.1% 10PPM 5K RL 12.4 kOhms 25 V
Veröffentlichungsdatum: 2010-02-10 | Aktualisiert: 2025-09-24